ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /

Sábháilte in:
Sonraí bibleagrafaíochta
Údair chorparáideacha: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formáid: Leictreonach Imeacht comhdhála Ríomhleabhar
Teanga:Béarla
Foilsithe / Cruthaithe: Materials Park, Ohio : ASM International, 2011.
Ábhair:
Rochtain ar líne:An electronic book accessible through the World Wide Web; click to view
Clibeanna: Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
Cur síos
Cur síos fisiciúil:xix, 456 p. : col. ill.
Leabharliosta:Includes bibliographical references and index.