ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
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| Corporate Authors: | , , , |
|---|---|
| Format: | Electronisk Conference Proceeding eBog |
| Sprog: | engelsk |
| Udgivet: |
Materials Park, Ohio :
ASM International,
2011.
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| Fag: | |
| Online adgang: | An electronic book accessible through the World Wide Web; click to view |
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| 020 | |z 9781615038268 | ||
| 020 | |z 9781615038503 (e-book) | ||
| 035 | |a (CaPaEBR)ebr10540844 | ||
| 035 | |a (OCoLC)787848235 | ||
| 040 | |a CaPaEBR |c CaPaEBR | ||
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| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (37th : |d 2011 : |c San Jose, Calif.) | |
| 245 | 1 | 0 | |a ISTFA 2011 |h [electronic resource] : |b conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA / |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. |
| 260 | |a Materials Park, Ohio : |b ASM International, |c 2011. | ||
| 300 | |a xix, 456 p. : |b col. ill. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2011. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 710 | 2 | |a ASM International. | |
| 710 | 2 | |a Electronic Device Failure Analysis Society. | |
| 710 | 2 | |a ebrary, Inc. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10540844 |z An electronic book accessible through the World Wide Web; click to view |
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