International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2011). ISTFA 2011: Conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA. ASM International.
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Čikaški stil citiranja (17. izdanje)
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, i Inc ebrary. ISTFA 2011: Conference Proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA. Materials Park, Ohio: ASM International, 2011.
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MLA način citiranja (9. izdanje)
International Symposium for Testing and Failure Analysis San Jose, Calif, et al. ISTFA 2011: Conference Proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA. ASM International, 2011.
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