Slika omota
QR kȏd

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

Pokaži ostale verzije (1)
Spremljeno u:
Autori kompanije: International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Elektronički Izvještaj sastanka e-knjiga
Jezik:engleski
Izdano: Materials Park, OH : ASM International, c2001.
Teme:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Electronic books.
Online pristup:An electronic book accessible through the World Wide Web; click to view
Oznake: Dodaj oznaku
Bez oznaka, Budi prvi tko označuje ovaj zapis!
Opis predmeta:Sponsored by EDFAS, ISTFA.
Opis fizičkog objekta:xix, 485 p. : ill.
Bibliografija:Includes bibliographical references and index.

Slični predmeti