ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

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书目详细资料
企业作者: International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
格式: 电子 会议录 电子书
语言:英语
出版: Materials Park, OH : ASM International, c2001.
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在线阅读:An electronic book accessible through the World Wide Web; click to view
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实物特征
Item Description:Sponsored by EDFAS, ISTFA.
实物描述:xix, 485 p. : ill.
参考书目:Includes bibliographical references and index.