ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

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Bibliographic Details
Corporate Authors: International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Electronic Conference Proceeding eBook
Language:English
Published: Materials Park, OH : ASM International, c2001.
Subjects:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
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MARC

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050 1 4 |a TK7871  |b .I69 2001eb 
111 2 |a International Symposium for Testing and Failure Analysis  |n (27th :  |d 2001 :  |c Santa Clara, Calif.) 
245 1 0 |a ISTFA 2001  |h [electronic resource] :  |b proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /  |c sponsored by EDFAS. 
246 3 0 |a Proceedings of the 27th International Symposium or Testing and Failure Analysis 
246 3 0 |a Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis 
260 |a Materials Park, OH :  |b ASM International,  |c c2001. 
300 |a xix, 485 p. :  |b ill. 
500 |a Sponsored by EDFAS, ISTFA. 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2009.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Electronics  |x Materials  |x Testing  |v Congresses. 
650 0 |a Electronic apparatus and appliances  |x Testing  |v Congresses. 
655 7 |a Electronic books.  |2 local 
710 2 |a ASM International. 
710 2 |a Electronic Device Failure Analysis Society. 
710 2 |a ebrary, Inc. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10320377  |z An electronic book accessible through the World Wide Web; click to view 
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