VLSI test principles and architectures design for testability /

Sábháilte in:
Sonraí bibleagrafaíochta
Rannpháirtithe: Wang, Laung-Terng, Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing
Formáid: Leictreonach Ríomhleabhar
Teanga:Béarla
Foilsithe / Cruthaithe: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Sraith:Morgan Kaufmann series in systems on silicon.
Ábhair:
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