Citazione Stile APA (7a Edizione)
Wang, L., Wu, C., & Wen, X. (2006). VLSI test principles and architectures: Design for testability. Elsevier Morgan Kaufmann Publishers.
Citazione stile Chigago Style (17a edizione)
Wang, Laung-Terng, Cheng-Wen Wu, e Xiaoqing Wen. VLSI Test Principles and Architectures: Design for Testability. Amsterdam ; Boston: Elsevier Morgan Kaufmann Publishers, 2006.
Citatione MLA (9a ed.)
Wang, Laung-Terng, et al. VLSI Test Principles and Architectures: Design for Testability. Elsevier Morgan Kaufmann Publishers, 2006.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.