VLSI test principles and architectures design for testability /

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Detalles Bibliográficos
Outros autores:	Wang, Laung-Terng, Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Series:	Morgan Kaufmann series in systems on silicon.
Subjects:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design. Electronic books.
Acceso en liña:	An electronic book accessible through the World Wide Web; click to view
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