VLSI test principles and architectures design for testability /
I tiakina i:
| Ētahi atu kaituhi: | , , |
|---|---|
| Hōputu: | Tāhiko īPukapuka |
| Reo: | Ingarihi |
| I whakaputaina: |
Amsterdam ; Boston :
Elsevier Morgan Kaufmann Publishers,
c2006.
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| Rangatū: | Morgan Kaufmann series in systems on silicon.
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| Ngā marau: | |
| Urunga tuihono: | An electronic book accessible through the World Wide Web; click to view |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
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