VLSI test principles and architectures design for testability /

समान संसाधन

• VLSI test principles and architectures design for testability /
  प्रकाशित: (2006)
• Power-constrained testing of VLSI circuits
  द्वारा: Nicolici, Nicola
  प्रकाशित: (2003)
• Power-constrained testing of VLSI circuits
  द्वारा: Nicolici, Nicola
  प्रकाशित: (2003)
• Mixed analog-digital VLSI devices and technology
  द्वारा: Tsividis, Yannis
  प्रकाशित: (2002)
• Mixed analog-digital VLSI devices and technology
  द्वारा: Tsividis, Yannis
  प्रकाशित: (2002)