VLSI test principles and architectures design for testability /
Enregistré dans:
| Autres auteurs: | , , |
|---|---|
| Format: | Électronique eBook |
| Langue: | anglais |
| Publié: |
Amsterdam ; Boston :
Elsevier Morgan Kaufmann Publishers,
c2006.
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| Collection: | Morgan Kaufmann series in systems on silicon.
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| Sujets: | |
| Accès en ligne: | An electronic book accessible through the World Wide Web; click to view |
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