Wafer-level testing and test during burn-in for integrated circuits

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Bibliographic Details
Main Author:	Bahukudumbi, Sudarshan
Corporate Author:	ebrary, Inc
Other Authors:	Chakrabarty, Krishnendu
Format:	Electronic eBook
Language:	English
Published:	Boston : Artech House, 2010.
Series:	Artech House integrated microsystems series.
Subjects:	Integrated circuits > Testing. Integrated circuits > Wafer-scale integration. Semiconductors > Testing. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
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