Power-constrained testing of VLSI circuits

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Bibliographic Details
Main Author:	Nicolici, Nicola
Corporate Author:	ebrary, Inc
Other Authors:	Al-Hashimi, Bashir
Format:	Electronic eBook
Language:	English
Published:	Boston : Kluwer Academic Publishers, c2003.
Series:	Frontiers in electronic testing ; 22.
Subjects:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Protection. Semiconductors > Thermal properties. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
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