Power-constrained testing of VLSI circuits
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| Hovedforfatter: | |
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| Format: | Electronisk eBog |
| Sprog: | engelsk |
| Udgivet: |
Boston :
Kluwer Academic Publishers,
c2003.
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| Serier: | Frontiers in electronic testing ;
22. |
| Fag: | |
| Online adgang: | An electronic book accessible through the World Wide Web; click to view |
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Lignende værker: Power-constrained testing of VLSI circuits
- Power-constrained testing of VLSI circuits
- VLSI test principles and architectures design for testability /
- VLSI test principles and architectures design for testability /
- Mixed analog-digital VLSI devices and technology
- Mixed analog-digital VLSI devices and technology
- VLSI custom microelectronics digital, analog, and mixed-signal /