Power-constrained testing of VLSI circuits
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| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
Boston :
Kluwer Academic Publishers,
c2003.
|
| Schriftenreihe: | Frontiers in electronic testing ;
22. |
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| Online-Zugang: | An electronic book accessible through the World Wide Web; click to view |
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