Terrestrial radiation effects in ULSI devices and electronic systems /

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Bibliographic Details
Main Author:	Ibe, Eishi H. (Author)
Format:	Electronic eBook
Language:	English
Published:	Singapore : IEEE : Wiley, 2015.
Subjects:	Electronic circuits > Effect of radiation on. Integrated circuits > Ultra large scale integration > Reliability. Integrated circuits > Effect of radiation on. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
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