Terrestrial radiation effects in ULSI devices and electronic systems /

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Xehetasun bibliografikoak
Egile nagusia:	Ibe, Eishi H. (Egilea)
Formatua:	Baliabide elektronikoa eBook
Hizkuntza:	ingelesa
Argitaratua:	Singapore : IEEE : Wiley, 2015.
Gaiak:	Electronic circuits > Effect of radiation on. Integrated circuits > Ultra large scale integration > Reliability. Integrated circuits > Effect of radiation on. Electronic books.
Sarrera elektronikoa:	An electronic book accessible through the World Wide Web; click to view
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

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