Terrestrial radiation effects in ULSI devices and electronic systems /

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Bibliographic Details
Main Author: Ibe, Eishi H. (Author)
Format: Electronic eBook
Language:English
Published: Singapore : IEEE : Wiley, 2015.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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LEADER 00000nam a2200000 i 4500
001 0000190585
005 20171002065629.0
006 m o d
007 cr cn|||||||||
008 150123t20152015si a ob 001 0 eng d
020 |z 9781118479292 
020 |a 9781118479315 (e-book) 
035 |a (CaPaEBR)ebr11004204 
035 |a (OCoLC)881318367 
040 |a CaPaEBR  |b eng  |e rda  |e pn  |c CaPaEBR 
050 1 4 |a TK7870.285  |b .I24 2015eb 
082 0 4 |a 621.3815  |2 23 
100 1 |a Ibe, Eishi H.,  |e author. 
245 1 0 |a Terrestrial radiation effects in ULSI devices and electronic systems /  |c Eishi H. Ibe. 
264 1 |a Singapore :  |b IEEE :  |b Wiley,  |c 2015. 
264 4 |c ©2015 
300 |a 1 online resource (295 pages) :  |b illustrations 
336 |a text  |2 rdacontent 
337 |a computer  |2 rdamedia 
338 |a online resource  |2 rdacarrier 
504 |a Includes bibliographical references at the end of each chapters and index. 
588 |a Description based on print version record. 
590 |a Electronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. 
650 0 |a Electronic circuits  |x Effect of radiation on. 
650 0 |a Integrated circuits  |x Ultra large scale integration  |x Reliability. 
650 0 |a Integrated circuits  |x Effect of radiation on. 
655 0 |a Electronic books. 
776 0 8 |i Print version:  |a Ibe, Eishi H.  |t Terrestrial radiation effects in ULSI devices and electronic systems.  |d Singapore : IEEE : Wiley, c2015  |h xxiv, 268 pages  |z 9781118479292  |w 2014022262 
797 2 |a ebrary. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=11004204  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 179718  |d 179718