Terrestrial radiation effects in ULSI devices and electronic systems /

Terrestrial radiation effects in ULSI devices and electronic systems /

Show other versions (1)
Saved in:
Bibliographic Details
Main Author: Ibe, Eishi H. (Author)
Format: Electronic eBook
Language:English
Published: Singapore : IEEE : Wiley, 2015.
Subjects:
Electronic circuits > Effect of radiation on.
Integrated circuits > Ultra large scale integration > Reliability.
Integrated circuits > Effect of radiation on.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Physical Description:1 online resource (295 pages) : illustrations
Bibliography:Includes bibliographical references at the end of each chapters and index.
ISBN:9781118479315 (e-book)

Similar Items