Radiation effects and soft errors in integrated circuits and electronic devices

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Bibliographic Details
Corporate Author: ebrary, Inc
Other Authors: Schrimpf, Ronald Donald, Fleetwood, D. M. (Dan M.)
Format: Electronic eBook
Language:English
Published: Singapore ; New Jersey : World Scientific Pub., c2004.
Series:Selected topics in electronics and systems ; vol. 34.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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