Power-constrained testing of VLSI circuits

Power-constrained testing of VLSI circuits

Show other versions (1)
Saved in:
Bibliographic Details
Main Author: Nicolici, Nicola
Corporate Author: ebrary, Inc
Other Authors: Al-Hashimi, Bashir
Format: Electronic eBook
Language:English
Published: Boston : Kluwer Academic Publishers, c2003.
Series:Frontiers in electronic testing ; 22.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Protection.
Semiconductors > Thermal properties.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
Tags: Add Tag
No Tags, Be the first to tag this record!

MARC

LEADER 00000nam a22000004a 4500
001 0000075403
005 20171002053745.0
006 m u
007 cr cn|||||||||
008 021209s2003 maua sb 001 0 eng
010 |z  2002043306 
020 |z 140207235X (alk. paper) 
035 |a (CaPaEBR)ebr10066763 
035 |a (OCoLC)70734587 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a TK7874.75  |b .N53 2003eb 
082 0 4 |a 621.39/5/0287  |2 21 
100 1 |a Nicolici, Nicola. 
245 1 0 |a Power-constrained testing of VLSI circuits  |h [electronic resource] /  |c by Nicola Nicolici and Bashir M. Al-Hashimi. 
260 |a Boston :  |b Kluwer Academic Publishers,  |c c2003. 
300 |a xi, 178 p. :  |b ill. 
490 1 |a Frontiers in electronic testing ;  |v 22 
504 |a Includes bibliographical references (p. 163-173) and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2013.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Testing. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Protection. 
650 0 |a Semiconductors  |x Thermal properties. 
655 7 |a Electronic books.  |2 local 
700 1 |a Al-Hashimi, Bashir. 
710 2 |a ebrary, Inc. 
830 0 |a Frontiers in electronic testing ;  |v 22. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10066763  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 64561  |d 64561 

Similar Items