Cita APA (7th ed.)
Nicolici, N., & Al-Hashimi, B. (2003). Power-constrained testing of VLSI circuits. Kluwer Academic Publishers.
Cita Chicago (17th ed.)
Nicolici, Nicola, i Bashir Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer Academic Publishers, 2003.
Cita MLA (9th ed.)
Nicolici, Nicola, i Bashir Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer Academic Publishers, 2003.
Atenció: Aquestes cites poden no estar 100% correctes.