Nicolici, N., & Al-Hashimi, B. (2003). Power-constrained testing of VLSI circuits. Kluwer Academic Publishers.
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Chicago-čujuhus (17. p.)
Nicolici, Nicola, juo Bashir Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer Academic Publishers, 2003.
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MLA-čujuhus (9. p.)
Nicolici, Nicola, juo Bashir Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer Academic Publishers, 2003.
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