VLSI test principles and architectures design for testability /
Wedi'i Gadw mewn:
| Awduron Eraill: | , , |
|---|---|
| Fformat: | Electronig eLyfr |
| Iaith: | Saesneg |
| Cyhoeddwyd: |
Amsterdam ; Boston :
Elsevier Morgan Kaufmann Publishers,
c2006.
|
| Cyfres: | Morgan Kaufmann series in systems on silicon.
|
| Pynciau: | |
| Mynediad Ar-lein: | An electronic book accessible through the World Wide Web; click to view |
| Tagiau: |
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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| Disgrifiad Corfforoll: | xxx, 777 p. : ill. ; 25 cm. |
|---|---|
| Llyfryddiaeth: | Includes bibliographical references and index. |