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VLSI test principles and architectures design for testability /

Taispeáin leaganacha eile (1)
Sábháilte in:
Rannpháirtithe: Wang, Laung-Terng, Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing
Formáid: Leictreonach Ríomhleabhar
Teanga:Béarla
Foilsithe / Cruthaithe: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Sraith:Morgan Kaufmann series in systems on silicon.
Ábhair:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Electronic books.
Rochtain ar líne:An electronic book accessible through the World Wide Web; click to view
Clibeanna: Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
Cur síos fisiciúil:xxx, 777 p. : ill. ; 25 cm.
Leabharliosta:Includes bibliographical references and index.

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