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VLSI test principles and architectures design for testability /

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Daljnji autori: Wang, Laung-Terng, Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing
Format: Elektronički e-knjiga
Jezik:engleski
Izdano: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Serija:Morgan Kaufmann series in systems on silicon.
Teme:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Electronic books.
Online pristup:An electronic book accessible through the World Wide Web; click to view
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Opis fizičkog objekta:xxx, 777 p. : ill. ; 25 cm.
Bibliografija:Includes bibliographical references and index.

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