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VLSI test principles and architectures design for testability /

I tiakina i:
Ētahi atu kaituhi: Wang, Laung-Terng, Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing
Hōputu: Tāhiko īPukapuka
Reo:Ingarihi
I whakaputaina: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Rangatū:Morgan Kaufmann series in systems on silicon.
Ngā marau:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Electronic books.
Urunga tuihono:An electronic book accessible through the World Wide Web; click to view
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MARC

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007 cr cn|||||||||
008 060227s2006 ne a sb 001 0 eng
010 |z  2006006869 
020 |z 0123705975 (hardcover : alk. paper) 
020 |z 9780123705976 
035 |a (CaPaEBR)ebr10169928 
035 |a (OCoLC)162573568 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a TK7874.75  |b .V587 2006eb 
082 0 4 |a 621.39/5  |2 22 
245 0 0 |a VLSI test principles and architectures  |h [electronic resource] :  |b design for testability /  |c edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. 
260 |a Amsterdam ;  |a Boston :  |b Elsevier Morgan Kaufmann Publishers,  |c c2006. 
300 |a xxx, 777 p. :  |b ill. ;  |c 25 cm. 
490 1 |a The Morgan Kaufmann series in systems on silicon 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2009.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Testing. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Design. 
655 7 |a Electronic books.  |2 local 
700 1 |a Wang, Laung-Terng. 
700 1 |a Wu, Cheng-Wen,  |c EE Ph. D. 
700 1 |a Wen, Xiaoqing. 
830 0 |a Morgan Kaufmann series in systems on silicon. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10169928  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 79253  |d 79253 

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