Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /

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Bibliographic Details
Corporate Author:	ebrary, Inc
Other Authors:	Dumin, D. J.
Format:	Electronic eBook
Language:	English
Published:	[River Edge, NJ] : World Scientific, c2002.
Series:	Selected topics in electronics and systems ; v. 23.
Subjects:	Metal oxide semiconductors > Reliability. Silicon oxide > Deterioration. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
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