Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Kaituhi rangatōpū: ebrary, Inc
Ētahi atu kaituhi: Dumin, D. J.
Hōputu: Tāhiko īPukapuka
Reo:Ingarihi
I whakaputaina: [River Edge, NJ] : World Scientific, c2002.
Rangatū:Selected topics in electronics and systems ; v. 23.
Ngā marau:
Urunga tuihono:An electronic book accessible through the World Wide Web; click to view
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