Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /
Sparad:
| Institutionellt upphov: | |
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| Övriga upphov: | |
| Materialtyp: | Elektronisk E-bok |
| Språk: | engelska |
| Utgiven: |
[River Edge, NJ] :
World Scientific,
c2002.
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| Serie: | Selected topics in electronics and systems ;
v. 23. |
| Ämnen: | |
| Länkar: | An electronic book accessible through the World Wide Web; click to view |
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