Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /
Gardado en:
| Autor Corporativo: | |
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| Outros autores: | |
| Formato: | Electrónico eBook |
| Idioma: | inglés |
| Publicado: |
[River Edge, NJ] :
World Scientific,
c2002.
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| Series: | Selected topics in electronics and systems ;
v. 23. |
| Subjects: | |
| Acceso en liña: | An electronic book accessible through the World Wide Web; click to view |
| Tags: |
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| Descrición Física: | ix, 270 p. : ill. |
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| Bibliografía: | Includes bibliographical references. |