Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /
Wedi'i Gadw mewn:
| Awdur Corfforaethol: | |
|---|---|
| Awduron Eraill: | |
| Fformat: | Electronig eLyfr |
| Iaith: | Saesneg |
| Cyhoeddwyd: |
[River Edge, NJ] :
World Scientific,
c2002.
|
| Cyfres: | Selected topics in electronics and systems ;
v. 23. |
| Pynciau: | |
| Mynediad Ar-lein: | An electronic book accessible through the World Wide Web; click to view |
| Tagiau: |
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
|
| Disgrifiad Corfforoll: | ix, 270 p. : ill. |
|---|---|
| Llyfryddiaeth: | Includes bibliographical references. |