Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /
Shranjeno v:
| Korporativna značnica: | |
|---|---|
| Drugi avtorji: | |
| Format: | Elektronski eKnjiga |
| Jezik: | angleščina |
| Izdano: |
[River Edge, NJ] :
World Scientific,
c2002.
|
| Serija: | Selected topics in electronics and systems ;
v. 23. |
| Teme: | |
| Online dostop: | An electronic book accessible through the World Wide Web; click to view |
| Oznake: |
Brez oznak, prvi označite!
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| Fizični opis: | ix, 270 p. : ill. |
|---|---|
| Bibliografija: | Includes bibliographical references. |