Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /
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| Corporate Author: | |
|---|---|
| Other Authors: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
[River Edge, NJ] :
World Scientific,
c2002.
|
| Series: | Selected topics in electronics and systems ;
v. 23. |
| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 245 | 0 | 0 | |a Oxide reliability |h [electronic resource] : |b a summary of silicon oxide wearout, breakdown, and reliability / |c editor, D.J. Dumin. |
| 260 | |a [River Edge, NJ] : |b World Scientific, |c c2002. | ||
| 300 | |a ix, 270 p. : |b ill. | ||
| 490 | 1 | |a Selected topics in electronics and systems ; |v v. 23 | |
| 504 | |a Includes bibliographical references. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2013. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Metal oxide semiconductors |x Reliability. | |
| 650 | 0 | |a Silicon oxide |x Deterioration. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 700 | 1 | |a Dumin, D. J. | |
| 710 | 2 | |a ebrary, Inc. | |
| 830 | 0 | |a Selected topics in electronics and systems ; |v v. 23. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10201190 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 85297 |d 85297 | ||