Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /

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Bibliographic Details
Corporate Author:	ebrary, Inc
Other Authors:	Dumin, D. J.
Format:	Electronic eBook
Language:	English
Published:	[River Edge, NJ] : World Scientific, c2002.
Series:	Selected topics in electronics and systems ; v. 23.
Subjects:	Metal oxide semiconductors > Reliability. Silicon oxide > Deterioration. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
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035			\|a (OCoLC)614462997
040			\|a CaPaEBR \|c CaPaEBR
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082	0	4	\|a 621.39/732 \|2 21
245	0	0	\|a Oxide reliability \|h [electronic resource] : \|b a summary of silicon oxide wearout, breakdown, and reliability / \|c editor, D.J. Dumin.
260			\|a [River Edge, NJ] : \|b World Scientific, \|c c2002.
300			\|a ix, 270 p. : \|b ill.
490	1		\|a Selected topics in electronics and systems ; \|v v. 23
504			\|a Includes bibliographical references.
533			\|a Electronic reproduction. \|b Palo Alto, Calif. : \|c ebrary, \|d 2013. \|n Available via World Wide Web. \|n Access may be limited to ebrary affiliated libraries.
650		0	\|a Metal oxide semiconductors \|x Reliability.
650		0	\|a Silicon oxide \|x Deterioration.
655		7	\|a Electronic books. \|2 local
700	1		\|a Dumin, D. J.
710	2		\|a ebrary, Inc.
830		0	\|a Selected topics in electronics and systems ; \|v v. 23.
856	4	0	\|u http://site.ebrary.com/lib/daystar/Doc?id=10201190 \|z An electronic book accessible through the World Wide Web; click to view
908			\|a 170314
942	0	0	\|c EB
999			\|c 85297 \|d 85297