Wafer-level testing and test during burn-in for integrated circuits
Guardado en:
| Autor principal: | |
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| Autor Corporativo: | |
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| Formato: | Electrónico eBook |
| Lenguaje: | inglés |
| Publicado: |
Boston :
Artech House,
2010.
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| Colección: | Artech House integrated microsystems series.
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| Materias: | |
| Acceso en línea: | An electronic book accessible through the World Wide Web; click to view |
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