Wafer-level testing and test during burn-in for integrated circuits
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| Autor principal: | |
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| Format: | Electrònic eBook |
| Idioma: | anglès |
| Publicat: |
Boston :
Artech House,
2010.
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| Col·lecció: | Artech House integrated microsystems series.
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| Matèries: | |
| Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
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