Citace podle APA (7th ed.)
Bahukudumbi, S., & Chakrabarty, K. (2010). Wafer-level testing and test during burn-in for integrated circuits. Artech House.
Citace podle Chicago (17th ed.)
Bahukudumbi, Sudarshan, a Krishnendu Chakrabarty. Wafer-level Testing and Test During Burn-in for Integrated Circuits. Boston: Artech House, 2010.
Citace podle MLA (9th ed.)
Bahukudumbi, Sudarshan, a Krishnendu Chakrabarty. Wafer-level Testing and Test During Burn-in for Integrated Circuits. Artech House, 2010.
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