Bahukudumbi, S., & Chakrabarty, K. (2010). Wafer-level testing and test during burn-in for integrated circuits. Artech House.
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Chicago Style (17th ed.) Citation
Bahukudumbi, Sudarshan, and Krishnendu Chakrabarty. Wafer-level Testing and Test During Burn-in for Integrated Circuits. Boston: Artech House, 2010.
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MLA引文
Bahukudumbi, Sudarshan, and Krishnendu Chakrabarty. Wafer-level Testing and Test During Burn-in for Integrated Circuits. Artech House, 2010.
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警告：這些引文格式不一定是100％准確.