Azala

QR Kodea

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

Gorde:

Xehetasun bibliografikoak
Egile korporatiboa:	International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formatua:	Baliabide elektronikoa Konferentzia-aktak eBook
Hizkuntza:	ingelesa
Argitaratua:	Materials Park, OH : ASM International, c2001.
Gaiak:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Sarrera elektronikoa:	An electronic book accessible through the World Wide Web; click to view
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Azala

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

Argitaratua c2001.

An electronic book accessible through the World Wide Web; click to view

Baliabide elektronikoa Konferentzia-aktak eBook