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ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

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Sonraí bibleagrafaíochta
Údair chorparáideacha:	International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formáid:	Leictreonach Imeacht comhdhála Ríomhleabhar
Teanga:	Béarla
Foilsithe / Cruthaithe:	Materials Park, OH : ASM International, c2001.
Ábhair:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Rochtain ar líne:	An electronic book accessible through the World Wide Web; click to view
Clibeanna:	Cuir clib leis Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!

Íomhá chlúdaigh

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

Foilsithe / Cruthaithe c2001.

An electronic book accessible through the World Wide Web; click to view

Leictreonach Imeacht comhdhála Ríomhleabhar