Power-constrained testing of VLSI circuits
Gorde:
| Egile nagusia: | |
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| Erakunde egilea: | |
| Beste egile batzuk: | |
| Formatua: | Baliabide elektronikoa eBook |
| Hizkuntza: | ingelesa |
| Argitaratua: |
Boston :
Kluwer Academic Publishers,
c2003.
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| Saila: | Frontiers in electronic testing ;
22. |
| Gaiak: | |
| Sarrera elektronikoa: | An electronic book accessible through the World Wide Web; click to view |
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