Power-constrained testing of VLSI circuits
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| Format: | Electrònic eBook |
| Idioma: | anglès |
| Publicat: |
Boston :
Kluwer Academic Publishers,
c2003.
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| Col·lecció: | Frontiers in electronic testing ;
22. |
| Matèries: | |
| Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
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