APA (7th ed.) Citation
Nicolici, N., & Al-Hashimi, B. (2003). Power-constrained testing of VLSI circuits. Kluwer Academic Publishers.
Chicago Style (17th ed.) Citation
Nicolici, Nicola, and Bashir Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer Academic Publishers, 2003.
MLA (9th ed.) Citation
Nicolici, Nicola, and Bashir Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer Academic Publishers, 2003.
Warning: These citations may not always be 100% accurate.