APA(7版)引用形式
Nicolici, N., & Al-Hashimi, B. (2003). Power-constrained testing of VLSI circuits. Kluwer Academic Publishers.
Chicagoスタイル(17版)引用形式
Nicolici, Nicola, , Bashir Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer Academic Publishers, 2003.
MLA(9版)引用形式
Nicolici, Nicola, , Bashir Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer Academic Publishers, 2003.
警告: この引用は必ずしも正確ではありません.