Power-constrained testing of VLSI circuits
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| Materyal Türü: | Elektronik Ekitap |
| Dil: | İngilizce |
| Baskı/Yayın Bilgisi: |
Boston :
Kluwer Academic Publishers,
c2003.
|
| Seri Bilgileri: | Frontiers in electronic testing ;
22. |
| Konular: | |
| Online Erişim: | An electronic book accessible through the World Wide Web; click to view |
| Etiketler: |
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MARC
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| 008 | 021209s2003 maua sb 001 0 eng | ||
| 010 | |z 2002043306 | ||
| 020 | |z 140207235X (alk. paper) | ||
| 035 | |a (CaPaEBR)ebr10066763 | ||
| 035 | |a (OCoLC)70734587 | ||
| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7874.75 |b .N53 2003eb |
| 082 | 0 | 4 | |a 621.39/5/0287 |2 21 |
| 100 | 1 | |a Nicolici, Nicola. | |
| 245 | 1 | 0 | |a Power-constrained testing of VLSI circuits |h [electronic resource] / |c by Nicola Nicolici and Bashir M. Al-Hashimi. |
| 260 | |a Boston : |b Kluwer Academic Publishers, |c c2003. | ||
| 300 | |a xi, 178 p. : |b ill. | ||
| 490 | 1 | |a Frontiers in electronic testing ; |v 22 | |
| 504 | |a Includes bibliographical references (p. 163-173) and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2013. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Integrated circuits |x Very large scale integration |x Testing. | |
| 650 | 0 | |a Integrated circuits |x Very large scale integration |x Protection. | |
| 650 | 0 | |a Semiconductors |x Thermal properties. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 700 | 1 | |a Al-Hashimi, Bashir. | |
| 710 | 2 | |a ebrary, Inc. | |
| 830 | 0 | |a Frontiers in electronic testing ; |v 22. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10066763 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 64561 |d 64561 | ||