VLSI test principles and architectures design for testability /
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| Andre forfattere: | , , |
|---|---|
| Format: | Electronisk eBog |
| Sprog: | engelsk |
| Udgivet: |
Amsterdam ; Boston :
Elsevier Morgan Kaufmann Publishers,
c2006.
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| Serier: | Morgan Kaufmann series in systems on silicon.
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| Fag: | |
| Online adgang: | An electronic book accessible through the World Wide Web; click to view |
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Lignende værker: VLSI test principles and architectures
- VLSI test principles and architectures design for testability /
- Power-constrained testing of VLSI circuits
- Power-constrained testing of VLSI circuits
- Mixed analog-digital VLSI devices and technology
- Mixed analog-digital VLSI devices and technology
- VLSI custom microelectronics digital, analog, and mixed-signal /