VLSI test principles and architectures design for testability /
Gardado en:
| Outros autores: | , , |
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| Formato: | Electrónico eBook |
| Idioma: | inglés |
| Publicado: |
Amsterdam ; Boston :
Elsevier Morgan Kaufmann Publishers,
c2006.
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| Series: | Morgan Kaufmann series in systems on silicon.
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| Subjects: | |
| Acceso en liña: | An electronic book accessible through the World Wide Web; click to view |
| Tags: |
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