Wang, L., Wu, C., & Wen, X. (2006). VLSI test principles and architectures: Design for testability. Elsevier Morgan Kaufmann Publishers.
Chicago-čujuhus (17. p.)Wang, Laung-Terng, Cheng-Wen Wu, juo Xiaoqing Wen. VLSI Test Principles and Architectures: Design for Testability. Amsterdam ; Boston: Elsevier Morgan Kaufmann Publishers, 2006.
MLA-čujuhus (9. p.)Wang, Laung-Terng, et al. VLSI Test Principles and Architectures: Design for Testability. Elsevier Morgan Kaufmann Publishers, 2006.
Muitte dárkkistit čujuhemiid riektatvuođa, ovdal go geavahat daid iežat deavsttas.