Wang, L., Wu, C., & Wen, X. (2006). VLSI test principles and architectures: Design for testability. Elsevier Morgan Kaufmann Publishers.
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Citación estilo Chicago
Wang, Laung-Terng, Cheng-Wen Wu, and Xiaoqing Wen. VLSI Test Principles and Architectures: Design for Testability. Amsterdam ; Boston: Elsevier Morgan Kaufmann Publishers, 2006.
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Cita MLA
Wang, Laung-Terng, et al. VLSI Test Principles and Architectures: Design for Testability. Elsevier Morgan Kaufmann Publishers, 2006.
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