VLSI test principles and architectures design for testability /
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| Other Authors: | , , |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Amsterdam ; Boston :
Elsevier Morgan Kaufmann Publishers,
c2006.
|
| Series: | Morgan Kaufmann series in systems on silicon.
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 008 | 060227s2006 ne a sb 001 0 eng | ||
| 010 | |z 2006006869 | ||
| 020 | |z 0123705975 (hardcover : alk. paper) | ||
| 020 | |z 9780123705976 | ||
| 035 | |a (CaPaEBR)ebr10169928 | ||
| 035 | |a (OCoLC)162573568 | ||
| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7874.75 |b .V587 2006eb |
| 082 | 0 | 4 | |a 621.39/5 |2 22 |
| 245 | 0 | 0 | |a VLSI test principles and architectures |h [electronic resource] : |b design for testability / |c edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. |
| 260 | |a Amsterdam ; |a Boston : |b Elsevier Morgan Kaufmann Publishers, |c c2006. | ||
| 300 | |a xxx, 777 p. : |b ill. ; |c 25 cm. | ||
| 490 | 1 | |a The Morgan Kaufmann series in systems on silicon | |
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2009. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Integrated circuits |x Very large scale integration |x Testing. | |
| 650 | 0 | |a Integrated circuits |x Very large scale integration |x Design. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 700 | 1 | |a Wang, Laung-Terng. | |
| 700 | 1 | |a Wu, Cheng-Wen, |c EE Ph. D. | |
| 700 | 1 | |a Wen, Xiaoqing. | |
| 830 | 0 | |a Morgan Kaufmann series in systems on silicon. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10169928 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 79253 |d 79253 | ||