Power-constrained testing of VLSI circuits
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| Format: | Elektronski eKnjiga |
| Jezik: | angleščina |
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Boston :
Kluwer Academic Publishers,
c2003.
|
| Serija: | Frontiers in electronic testing ;
22. |
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| Online dostop: | An electronic book accessible through the World Wide Web; click to view |
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Power-constrained testing of VLSI circuits
Izdano c2003.
An electronic book accessible through the World Wide Web; click to view
Elektronski
eKnjiga