Scanning probe microscopy for industrial applications : nanomechanical characterization /
保存先:
| その他の著者: | |
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| フォーマット: | 電子媒体 eBook |
| 言語: | 英語 |
| 出版事項: |
Hoboken, New Jersey :
Wiley,
2014.
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| 主題: | |
| オンライン･アクセス: | An electronic book accessible through the World Wide Web; click to view |
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