Scanning probe microscopy for industrial applications : nanomechanical characterization /

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Bibliographic Details
Other Authors: Yablon, Dalia G., 1975-
Format: Electronic eBook
Language:English
Published: Hoboken, New Jersey : Wiley, 2014.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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040 |a CaPaEBR  |b eng  |e rda  |e pn  |c CaPaEBR 
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082 0 4 |a 620.1/127  |2 23 
245 0 0 |a Scanning probe microscopy for industrial applications :  |b nanomechanical characterization /  |c edited by Dalia G. Yablon. 
264 1 |a Hoboken, New Jersey :  |b Wiley,  |c 2014. 
264 4 |c ©2014 
300 |a 1 online resource (385 pages) :  |b illustrations (some color), graphs 
336 |a text  |2 rdacontent 
337 |a computer  |2 rdamedia 
338 |a online resource  |2 rdacarrier 
504 |a Includes bibliographical references at the end of each chapters and index. 
588 |a Description based on print version record. 
590 |a Electronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. 
650 0 |a Materials  |x Microscopy. 
650 0 |a Scanning probe microscopy  |x Industrial applications. 
655 0 |a Electronic books. 
700 1 |a Yablon, Dalia G.,  |d 1975- 
776 0 8 |i Print version:  |t Scanning probe microscopy for industrial applications : nanomechanical characterization.  |d Hoboken, New Jersey : Wiley, c2014  |h xix, 347 pages  |z 9781118288238  |w 2013009638 
797 2 |a ebrary. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10788041  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 165260  |d 165260