Yablon, D. G. (2014). Scanning probe microscopy for industrial applications: Nanomechanical characterization. Wiley.
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Citação norma Chicago
Yablon, Dalia G. Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Hoboken, New Jersey: Wiley, 2014.
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Citação norma MLA
Yablon, Dalia G. Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Wiley, 2014.
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Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.