Omslagsbillede
QR Code

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /

Show other versions (1)
Saved in:
Corporate Authors: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Electronisk Conference Proceeding eBog
Sprog:engelsk
Udgivet: Materials Park, Ohio : ASM International, 2011.
Fag:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Electronic books.
Online adgang:An electronic book accessible through the World Wide Web; click to view
Tags: Tilføj Tag
Ingen Tags, Vær først til at tagge denne postø!
Fysisk beskrivelse:xix, 456 p. : col. ill.
Bibliografi:Includes bibliographical references and index.

Lignende værker