ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /

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企业作者: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
格式: 电子 会议录 电子书
语言:英语
出版: Materials Park, Ohio : ASM International, 2011.
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