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ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

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Wedi'i Gadw mewn:
Awduron Corfforaethol: International Symposium for Testing and Failure Analysis Los Angeles, Calif., ASM International. Electronic Materials and Processing Division, ebrary, Inc
Fformat: Electronig Trafodyn Cynhadledd eLyfr
Iaith:Saesneg
Cyhoeddwyd: Materials Park, Ohio : ASM International, c1996.
Pynciau:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Electronic books.
Mynediad Ar-lein:An electronic book accessible through the World Wide Web; click to view
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