ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

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Bibliographic Details
Corporate Authors: International Symposium for Testing and Failure Analysis Los Angeles, Calif., ASM International. Electronic Materials and Processing Division, ebrary, Inc
Format: Electronic Conference Proceeding eBook
Language:English
Published: Materials Park, Ohio : ASM International, c1996.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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111 2 |a International Symposium for Testing and Failure Analysis  |n (22nd :  |d 1996 :  |c Los Angeles, Calif.) 
245 1 0 |a ISTFA '96  |h [electronic resource] :  |b proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California. 
260 |a Materials Park, Ohio :  |b ASM International,  |c c1996. 
300 |a xiv, 417 p. :  |b ill. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2013.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Electronics  |x Materials  |x Testing  |v Congresses. 
650 0 |a Electronic apparatus and appliances  |x Testing  |v Congresses. 
655 7 |a Electronic books.  |2 local 
710 2 |a ASM International.  |b Electronic Materials and Processing Division. 
710 2 |a ebrary, Inc. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10323517  |z An electronic book accessible through the World Wide Web; click to view 
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