ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

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Xehetasun bibliografikoak
Egile korporatiboa:	International Symposium for Testing and Failure Analysis Los Angeles, Calif., ASM International. Electronic Materials and Processing Division, ebrary, Inc
Formatua:	Baliabide elektronikoa Konferentzia-aktak eBook
Hizkuntza:	ingelesa
Argitaratua:	Materials Park, Ohio : ASM International, c1996.
Gaiak:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Sarrera elektronikoa:	An electronic book accessible through the World Wide Web; click to view
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

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