ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

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Bibliografische gegevens
Coauteurs:	International Symposium for Testing and Failure Analysis Los Angeles, Calif., ASM International. Electronic Materials and Processing Division, ebrary, Inc
Formaat:	Elektronisch Conferentie akten E-boek
Taal:	Engels
Gepubliceerd in:	Materials Park, Ohio : ASM International, c1996.
Onderwerpen:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Online toegang:	An electronic book accessible through the World Wide Web; click to view
Tags:	Voeg label toe Geen labels, Wees de eerste die dit record labelt!

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