Atomic force microscopy exploring basic modes and advanced applications /
Guardado en:
| Autor principal: | |
|---|---|
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Lenguaje: | inglés |
| Publicado: |
Hoboken, N.J. :
John Wiley & Sons,
c2012.
|
| Materias: | |
| Acceso en línea: | An electronic book accessible through the World Wide Web; click to view |
| Etiquetas: |
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
Ejemplares similares: Atomic force microscopy
- Atomic force microscopy in liquid biological applications /
- Scanning force microscopy with applications to electric, magnetic, and atomic forces /
- Atomic force microscopy for biologists
- Introduction to scanning tunneling microscopy
- Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM)
- Scanning probe microscopy