Atomic force microscopy exploring basic modes and advanced applications /
Guardat en:
| Autor principal: | |
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| Autor corporatiu: | |
| Format: | Electrònic eBook |
| Idioma: | anglès |
| Publicat: |
Hoboken, N.J. :
John Wiley & Sons,
c2012.
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| Matèries: | |
| Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
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