Atomic force microscopy exploring basic modes and advanced applications /
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| Main Author: | |
|---|---|
| Corporate Author: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Hoboken, N.J. :
John Wiley & Sons,
c2012.
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 008 | 120302s2012 njua sb 001 0 eng d | ||
| 010 | |z 2012003429 | ||
| 020 | |z 9780470638828 | ||
| 020 | |z 9781118360699 (ebook) | ||
| 035 | |a (CaPaEBR)ebr10606048 | ||
| 035 | |a (OCoLC)810936286 | ||
| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a QH212.A78 |b H38 2012eb |
| 082 | 0 | 4 | |a 620/.5 |2 23 |
| 100 | 1 | |a Haugstad, Greg, |d 1963- | |
| 245 | 1 | 0 | |a Atomic force microscopy |h [electronic resource] : |b exploring basic modes and advanced applications / |c Greg Haugstad. |
| 260 | |a Hoboken, N.J. : |b John Wiley & Sons, |c c2012. | ||
| 300 | |a xxii, 464 p. : |b ill. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2011. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Atomic force microscopy. | |
| 650 | 0 | |a Scanning proble microscopy. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 710 | 2 | |a ebrary, Inc. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10606048 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 146556 |d 146556 | ||