Digital holography for MEMS and microsystem metrology
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| Autor kompanije: | |
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| Daljnji autori: | |
| Format: | Elektronički e-knjiga |
| Jezik: | engleski |
| Izdano: |
Chichester, West Sussex, U.K. ; Hoboken, N.J. :
Wiley,
2011.
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| Serija: | Wiley microsystem and nanotechnology series.
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| Teme: | |
| Online pristup: | An electronic book accessible through the World Wide Web; click to view |
| Oznake: |
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Slični predmeti: Digital holography for MEMS and microsystem metrology
- Digital holography for MEMS and microsystem metrology
- Hermeticity testing of MEMS and microelectronic packages /
- Hermeticity testing of MEMS and microelectronic packages /
- Understanding MEMS : principles and applications /
- Understanding MEMS : principles and applications /
- Analysis and design principles of MEMS devices