ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /

Show other versions (1)
Saved in:
Bibliographic Details
Corporate Authors: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Electronic Conference Proceeding eBook
Language:English
Published: Materials Park, OH : ASM International, c2005.
Subjects:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
Tags: Add Tag
No Tags, Be the first to tag this record!

MARC

LEADER 00000nam a2200000Ia 4500
001 0000112475
005 20171002055926.0
006 m u
007 cr cn|||||||||
008 051221s2005 ohua sb 101 0 eng d
020 |z 087170823X 
035 |a (CaPaEBR)ebr10323479 
035 |a (OCoLC)646817795 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a TK7871  |b .I63 2005eb 
111 2 |a International Symposium for Testing and Failure Analysis  |n (31st :  |d d2005 :  |c San Jose, Calif.) 
245 1 0 |a ISTFA 2005  |h [electronic resource] :  |b Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /  |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International. 
260 |a Materials Park, OH :  |b ASM International,  |c c2005. 
300 |a xviii, 524 p. :  |b ill. 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2009.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Electronics  |x Materials  |x Testing  |v Congresses. 
650 0 |a Electronic apparatus and appliances  |x Testing  |v Congresses. 
655 7 |a Electronic books.  |2 local 
710 2 |a ASM International. 
710 2 |a Electronic Device Failure Analysis Society. 
710 2 |a ebrary, Inc. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10323479  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 101625  |d 101625 

Similar Items