ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /

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מידע ביבליוגרפי
Corporate Authors:	International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
פורמט:	אלקטרוני Conference Proceeding ספר אלקטרוני
שפה:	אנגלית
יצא לאור:	Materials Park, OH : ASM International, c2005.
נושאים:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
גישה מקוונת:	An electronic book accessible through the World Wide Web; click to view
תגים:	הוספת תג אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!

MARC


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020			\|z 087170823X
035			\|a (CaPaEBR)ebr10323479
035			\|a (OCoLC)646817795
040			\|a CaPaEBR \|c CaPaEBR
050	1	4	\|a TK7871 \|b .I63 2005eb
111	2		\|a International Symposium for Testing and Failure Analysis \|n (31st : \|d d2005 : \|c San Jose, Calif.)
245	1	0	\|a ISTFA 2005 \|h [electronic resource] : \|b Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California / \|c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International.
260			\|a Materials Park, OH : \|b ASM International, \|c c2005.
300			\|a xviii, 524 p. : \|b ill.
504			\|a Includes bibliographical references and index.
533			\|a Electronic reproduction. \|b Palo Alto, Calif. : \|c ebrary, \|d 2009. \|n Available via World Wide Web. \|n Access may be limited to ebrary affiliated libraries.
650		0	\|a Electronics \|x Materials \|x Testing \|v Congresses.
650		0	\|a Electronic apparatus and appliances \|x Testing \|v Congresses.
655		7	\|a Electronic books. \|2 local
710	2		\|a ASM International.
710	2		\|a Electronic Device Failure Analysis Society.
710	2		\|a ebrary, Inc.
856	4	0	\|u http://site.ebrary.com/lib/daystar/Doc?id=10323479 \|z An electronic book accessible through the World Wide Web; click to view
908			\|a 170314
942	0	0	\|c EB
999			\|c 101625 \|d 101625