Cita APA (7th ed.)
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2005). ISTFA 2005: Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California. ASM International.
Cita Chicago (17th ed.)
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, i Inc ebrary. ISTFA 2005: Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California. Materials Park, OH: ASM International, 2005.
Cita MLA (9th ed.)
International Symposium for Testing and Failure Analysis San Jose, Calif, et al. ISTFA 2005: Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California. ASM International, 2005.
Atenció: Aquestes cites poden no estar 100% correctes.